Materials Characterization
- Small angle X-ray scatterometer (SAXS) [Xenocs Xeuss 2.0]
- X-ray diffractometer (XRD)
- Physical property measurement system (PPMS)
- Focus ion beam system (FIB) [Thermoscientific Scios 2]
- High resolution transmission electron microscope (TEM)
- Field emission scanning electron microscopes (SEM)
Scanning probe microscope (AFM, STM)
- Thermal analysis (DSC, TGA, TMA, DMA)
- Mechanical testing (tensile, compression, impact, hardness)
Equipment for Optical
- MeasurementConfocal microscope [Leica TCS SP8 X]
- Visible light microscope (reflection, transmission, stereo)
- UV/Vis double beam spectrophotometer
- Multimode microplate reader
- MicroRaman spectrometer
- FTIR spectrometer
Thin Film Deposition Facilities
- High vacuum e-beam and thermal evaporation coating system
- Sputter coating system
- Spin coater
Others
- Fluorescence Activated Cell Sorter (FACS)
- Nanoparticle tracking analyzer
- Zetasizer